Exel-Labs Logo

Specializing in Industrial Problem Solving,
Failure Analysis, Laboratory, and R&D


Analytical Testing Capabilities

  • Scanning Electron Microscopy (SEM)
  • Energy Dispersive X-ray Analysis (EDX)
  • Energy Dispersive Spectroscopy (EDS)
  • Wavelength Dispersive X-ray Analysis (WDX)
  • Secondary Electron Imaging (SEI)
  • Backscattered Electron Imaging (BEI)
  • Automated WDX Analysis
  • Atomic Force Microscopy (AFM)
  • Scanning Probe Microscopy (SPM)
  • Roughness Measurements
  • Optical Microscopy
  • Stereomicroscopy
  • X-ray Mapping
  • X-ray Linescan Analysis
  • Quantitative Image Analysis (QIA)
  • Accelerated Life Testing
  • X-ray Photoelectron Spectroscopy (XPS)
  • Electron Spectroscopy for Chemical Analysis (ESCA)
  • Fourier Transform Infrared Analysis (FTIR)
  • Attenuated total Reflectance (ATR)
  • Differential Scanning Calorimetry (DSC)
  • Thermogravimetric Analysis (TGA)
  • Inductively Coupled Plasma Analysis (ICP)
  • Outsource options (TEM, Raman, ToF- SIMS, GC/MS)


Exel Laboratory Services, 158 W. Clinton St., Unit V, Mail Stop #7, Dover, NJ 07801. (973) 620-9993 - phone | (973) 620-9994 - fax | (973) 479-7280 - cell
email address

Copyright © 2015 Exel Laboratory Services, All Rights Reserved.
Last Update: 03-01-2015