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Specializing in Industrial Problem Solving,
Failure Analysis, Laboratory, and R&D


Leaf epidermal hair

In-Situ FE-SEM Imaging of Hydrated Materials

At Exel Labs we can now examine your hydrated, wet, uncoated materials directly in a high resolution Field Emission SEM with a new state-of-the-art charge reduction module.

Click on the image to view our live video of a green leaf inside the high vacuum system of the FE-SEM.
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EXEL LABORATORY SERVICES:

  • Advanced Capabilities in SEM, Surface Analysis, and Material Characterization.
  • Over 30 Years Experience in Industrial Problem Solving.
    The Mini-SEM and state-of-the art EDS Systems.
  • A World-Wide Network with University, Government, Outside Labs, and Industry Partners.
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  • Scanning Electron Microscopy (SEM)
  • Energy Dispersive X-ray Analysis (EDX)
  • Energy Dispersive Spectroscopy (EDS)
  • Wavelength Dispersive X-ray Analysis (WDX)
  • Secondary Electron Imaging (SEI)
  • Backscattered Electron Imaging (BEI)
  • Automated WDX Analysis
  • Atomic Force Microscopy (AFM)
  • Scanning Probe Microscopy (SPM)
  • Roughness Measurements
  • Optical Microscopy
  • Stereomicroscopy
  • X-ray Mapping
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  • X-ray Linescan Analysis
  • Quantitative Image Analysis (QIA)
  • Accelerated Life Testing
  • X-ray Photoelectron Spectroscopy (XPS)
  • Electron Spectroscopy for Chemical Analysis (ESCA)
  • Fourier Transform Infrared Analysis (FTIR)
  • Attenuated total Reflectance (ATR)
  • Differential Scanning Calorimetry (DSC)
  • Thermogravimetric Analysis (TGA)
  • Inductively Coupled Plasma Analysis (ICP)
  • Outsource options (TEM, Raman, ToF- SIMS, GC/MS)
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Exel Laboratory Services, 158 W. Clinton St., Unit V, Mail Stop #7, Dover, NJ 07801. (973) 620-9993 - phone | (973) 620-9994 - fax | (973) 479-7280 - cell
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Last Update: 03-01-2015